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Jon Orloff
Jon Orloff (1942) is an American physicist, author and professor. He is the eldest son Monford Orloff and brother of pianist Carole Orloff and historian Chester Orloff. Professor Orloff is known for his major fields of research in charged particle optics, applications of field emission processes, high brightness electron and ion sources, focused ion and electron beams and their applications for micromachining, surface analysis and microscopy and Instrumentation development for semiconductor device manufacturing.
==Career==
Dr. Orloff received his B.S. in physics from M.I.T. in 1964 and a Ph.D. in applied physics from the Oregon Graduate Institute in 1977. From 1978 to 1985 he was an Associate Professor of Applied Physics at the Oregon Graduate Institute. He was a full professor in the Department of Applied Physics and Electrical Engineering from 1984-1993. In the summer of 1985 he went to France as a Visiting Scientist by invitation, of CNRS Laboratoire de Microstructures et Microelectronique in Bagneux. During his time at OGC he developed high resolution focused ion beam (FIB) technology, and did optics design for FEI Company, of which he was the fourth partner, and where he also sat on the board of directors. His father Monford Orloff was Chairman of FEI until his retirement in 1997. Orloff was a Professor at the University of Maryland, College Park in the Department of Electrical and Computer Engineering from 1993 until his retirement in 2006. He has authored or co-authored more than 80 publications including a Scientific American article and the books "Handbook of Charged Particle Optics," of which he is the editor, and "High Resolution Focused Ion Beams," with L.W. Swanson and M. Utlaut.
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